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Aehr Test Systems is the leader in wafer level burn-in for silicon carbide (SiC), gallium nitride (GaN), optical photonics, and memory integrated circuits.
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Aehr Test Systems
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Semiconductor Test and Burn-in | Aehr Test Systems Menu Item About Products Single Wafer FOX-CP FOX-1P WaferPak Contactor Multi Wafer FOX-XP FOX-NP Automated WaferPak Aligner WaferPak Contactor Die Level FOX-XP FOX-NP Automated DiePak Loader DiePak Carrier Packaged Parts ABTS Automated ABTS BIB Loader Burn-in Boards System Level Test Markets Automotive Mobile Silicon Photonics Memory & Logic Silicon Carbide Technology Contact Offices Contact Form Wafer Level Burn-in and Test of SiC Learn More Leader in Silicon Carbide Wafer Level Burn-in and Test Screening Proven Wafer Level Solution for VCSELs and Optical Communications Light Learn More Learn More Burn-in and Test of Multi-Die Modules for Mobile and AR/VR 3D Sensors Learn More Addressing Growing Quality and Reliability Requirements for Automotive Sensors Driver Assist Learn More 40+ Years Expertise in Semiconductor Test and Burn-i...
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