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raw text

Home For measurement videos on selected models please click here. Please contact us for application notes at sales@zebraoptical.com Projection Tool for Topography and QE Uniformity Spectral Mapping Characterisation View our company presentation here. Dimensional and Stress Metrology for Bow and Warp measurements on crystalline, thin film materials, and minipanels. W afer thickness measurement T rench depth measurement M embrane thickness measurement L aser and LED application MEMs tomography applications New metrology for X-ray mirrors (Video demo) . We have developed a range from focus tool for roughness measurement. Click here for details . Quantum Efficiency (QE) Uniformity measurements, using white light and color scanner technology. Glass Bow, Roller Wave, full Glass substrate scalable metrology (0.5 m x 1 m, 2 m x 2 m), and larger glass. Interferometric Probe a Non Contact Wafer Thickness and Wafer Topo- and Tomography...

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